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Digital Electronics Competitive Exam MCQs – Practice Test 21 (Chapter 21)

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Read Only Memory ROM MCQs – Practice Test 21 PDF Download

MCQ 101: Negative charge trapped on floating gate will cause electrons to repelled from:

  1. surface of Si
  2. sides of Si
  3. bottom of Si
  4. bottom of Al

MCQ 102: Static power dissipation in MOS ROM can be eliminated by connecting gate to:

  1. discharge line
  2. precharge line
  3. constant line
  4. zero line

MCQ 103: RDSR is used in EEPROM to:

  1. write enable
  2. write disable
  3. read status register
  4. write status register

MCQ 104: Etching process can be done by selecting the particular:

  1. mask
  2. desk
  3. bit
  4. dye

MCQ 105: Endurance and data retention are two eliminations of:

  1. copied data
  2. deleted data
  3. stored data
  4. past data

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