Electronic Devices Certification Exam Tests
Electronic Devices Practice Test 14
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MCQ 66: For a forward bias diode, increase in temperature cause forward current to
MCQ 67: Diode which maintains constant current rather than maintaining constant voltage is termed as
MCQ 68: Breakdown which occurs in both rectifier and Zener diodes at sufficiently high reverse voltage is
MCQ 69: Device which is used to couple the AC input from source to rectifier is
MCQ 70: JFET forward transconductance is expressed as a ratio and has the unit of
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