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Integrated Circuits Competitive Exam MCQs – Mock Test 67

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Challenges in Digital Design MCQs – Mock Test 67 PDF Download

MCQ 331: The most common clock signal is in the form of a:

  1. sinusoidal wave
  2. discrete wave
  3. square wave
  4. pulse wave

MCQ 332: The detection of errors caused by noise or other impairments during transmission from the transmitter to the receiver is referred as:

  1. Error Correction
  2. Error Detection
  3. Error Addition
  4. Error bit Declaration

MCQ 333: Any phenomenon by which a signal transmitted on one circuit or channel of a transmission system creates an undesired effect in another circuit or channel is called:

  1. Noise
  2. Crosstalk
  3. Direct talk
  4. Signal

MCQ 334: FinFET which provides large W is:

  1. Tall FinFET
  2. Short FinFET
  3. Nanowire FinFET
  4. Medium FinFET

MCQ 335: The detection of errors and reconstruction of the original, error-free data is referred as:

  1. Error Correction
  2. Error Detection
  3. Error Addition
  4. Error bit Declaration

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