Integrated Circuits Certification Exam Tests
Integrated Circuits Practice Test 67
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MCQ 331: The most common clock signal is in the form of a
MCQ 332: The detection of errors caused by noise or other impairments during transmission from the transmitter to the receiver is referred as
MCQ 333: Any phenomenon by which a signal transmitted on one circuit or channel of a transmission system creates an undesired effect in another circuit or channel is called
MCQ 334: FinFET which provides large W is
MCQ 335: The detection of errors and reconstruction of the original, error-free data is referred as
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